More accurate test result is the unremitting pursuit of Skyray; meanwhile, we constantly bear in mind to provide customers with superior service. The newly developed EDX 9000 exactly upholds the concept. It not only inherits the merits of Skyray EDX series, but also adopts the most advanced detection technology (X-SDD), which reduces test time to only 1 second. In addition, EDX 9000 also introduces Skyray patented product – precise positioning system, which can realize image coordinated control, multi-point continuous test. The new electric sample chamber makes operation easier, and the new designed automatic sample platform guarantees accurate detection
Analytical range: from S to U
Stability (RSD): 0.02%
Detector: X-Silicon Drift Detector (X-SDD)
Resolution: ≤ 135eV
Tube current: ≤1000uA
Tube voltage: 5~50kV
Measuring time: 1s (default)
Filter: 4 filters
Collimator: 8 collimators
Sample observation: HD industrial camera
Humidity: ≤70%
Temperature: 15℃~30℃
Input voltage: AC 220V±5V (suggest to use AC stabilizer)
X-Silicon Drift Detector (X-SDD)
Digital multichannel analytic system
X ray source
High and low voltage power supply
Collimation filter system
Precise sample platform
Optical shutter system
Sample observation system
Electronic control system
PC and ink-jet printer
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