EDX 3600B

EDX 3600B X-ray Fluorescence spectrometer uses XRF technology for rapid and
accurate elemental analysis of cement and steel. The technology features low-energy
X-rays specififcally for excitation of light elements such as Si, S, Na and Mg; and with
automatic spectrum stabilizing EDX3600B delivers accurate results for light elements
testing. UHRD detector provide excellent energy linearity, energy resolution and high
peak-background ratio.
EDX3600B can be configured for many types of
applications based on specific user analysis



  • Measurable elements: Na to U
  • Range of element content: 1ppm-99.99%
  • Ability of simultaneous analysis: 24 elements
  • Plating thickness measurement: more than 11 layers, up to 0.005μm each layer
  • Analysis accuracy: 0.05%
  • Forms of samples: powder, solid and liquid
  • Measurement time: 60s—200s
  • Energy resolution: (150±5)eV
  • Tube voltage: 5KV—50KV
  • Tube current: 50uA—1000uA
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